What Do Baggage Handling and mRNA Have In Common: Object-Process Methodology In Service of Science and Systems Engineering
Dov Dori, Technion, Israel Institute of Technology, Massachusetts Institute of Technology
Friday, February 15, 2013, 3:30pm
This seminar is part of the Jones Seminars on Science, Technology, and Society series.
Complex systems, be they natural or man-made, require a formal rigorous, yet intuitive, modeling framework to express their function, structure, and behavior. Conceptual modeling is a human intellectual activity that aims to capture the essence of systems – the functions they provide and the way they are structured and operate. Object-Process Methodology (OPM) has been evolving in the last two decades as a paradigm and a language for conceptual modeling of complex systems and is in the process of becoming an ISO standard. OPM has a compact set of building blocks: stateful objects and processes that transform them. In the talk I will present the principles of OPM and show its applications for modeling systems in two seemingly disparate domains: international airport baggage handling in the domain of systems engineering and the mRNA lifecycle in the domain of systems biology.
About the Speaker
Dov Dori is Information and Systems Engineering Professor and Head of the Enterprise System Modeling Laboratory at the Faculty of Industrial Engineering and Management, Technion, Israel Institute of Technology, and Research Affiliate at the Engineering Systems Division, Massachusetts Institute of Technology, where he lectures on a regular basis. His research interests include conceptual modeling of complex systems, systems architecture and design, software and systems engineering, and systems biology. Professor Dori invented and developed Object-Process Methodology (OPM), the emerging 19450 ISO Standard. He has authored or edited five books and over 200 journal and conference publications and book chapters. He is Fellow of INCOSE – International Council on Systems Engineering, Fellow of IAPR – International Association for Pattern Recognition, and Senior Member of IEEE and ACM.